首页> 外国专利> SUPER-RESOLUTION MICROSCOPY METHODS AND SYSTEMS ENHANCED BY ARRAYS OF SUPERLENSES WITH WIDE FIELD-OF-VIEW

SUPER-RESOLUTION MICROSCOPY METHODS AND SYSTEMS ENHANCED BY ARRAYS OF SUPERLENSES WITH WIDE FIELD-OF-VIEW

机译:具有宽视野的超标态阵列增强的超分辨率显微镜方法和系统

摘要

A super-resolution optical imaging method and system, including: providing a periodic monolayer array of dielectric spheres or cylinders with a sufficiently small period such that the fields-of-view produced by the spheres or cylinders overlap providing an enlarged field-of-view; wherein the dielectric spheres or cylinders are fixed in their positions such that the array is adapted to be brought adjacent to a sample to be optically imaged as a whole; and applying pressure to the array to reduce a gap separating the dielectric spheres or cylinders from the sample to achieve super-resolution imaging with the enlarged field-of-view. The super-resolution optical imaging method and system further comprising positioning the dielectric spheres or cylinders adjacent to one another in the array by air suction through a periodic micro-hole array providing a monolayer arrangement with a negligible defect rate.
机译:超分辨率的光学成像方法和系统,包括:提供具有足够小时段的介电球体或汽缸的周期单层阵列,使得由球体或汽缸产生的视野重叠提供放大的视野;其中介电球或汽缸固定在它们的位置,使得阵列适于与作为整体的样品相邻地置于待光学成像的样品附近;并向阵列施加压力以减小与样品中的介电球体或汽缸分离的间隙,以实现具有扩大视场的超分辨率成像。超分辨率光学成像方法和系统还包括通过空气抽吸在阵列中通过空气抽吸将彼此相邻的介电球或圆柱体定位通过周期性的微孔阵列,其提供具有可忽略的缺陷率的单层布置。

著录项

  • 公开/公告号US2021208414A1

    专利类型

  • 公开/公告日2021-07-08

    原文格式PDF

  • 申请/专利权人 VASILY N. ASTRATOV;

    申请/专利号US202117143445

  • 发明设计人 VASILY N. ASTRATOV;

    申请日2021-01-07

  • 分类号G02B27/58;G02B21/33;G02B21/34;

  • 国家 US

  • 入库时间 2022-08-24 19:46:21

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