首页> 外国专利> FREQUENCY SHIFTER FOR HETERODYNE INTERFEROMETRY MEASUREMENTS AND DEVICE FOR HETERODYNE INTERFEROMETRY MEASUREMENTS HAVING SUCH A FREQUENCY SHIFTER

FREQUENCY SHIFTER FOR HETERODYNE INTERFEROMETRY MEASUREMENTS AND DEVICE FOR HETERODYNE INTERFEROMETRY MEASUREMENTS HAVING SUCH A FREQUENCY SHIFTER

机译:用于外差干涉测量测量的变频器和用于具有这种频率移位器的外差干涉测量测量的装置

摘要

The invention refers to a frequency shifter for heterodyne interferometry measurements, comprising a chip, an input waveguide configured to guide a light beam, at least four phase modulators, each being arranged to receive the light beam from the input waveguide and configured to modulate a phase of the light beam, an output combiner being arranged to let the light beams modulated by each phase modulator interfere, a first output waveguide coupled to the output combiner and configured to receive the modulated light beams constructively interfering at the output combiner, a second output waveguide coupled to the output combiner and configured to receive the modulated light beams destructively interfering at the output combiner, wherein the input waveguide, the phase modulators, the output combiner, the first output waveguide and the second output waveguide are arranged on the chip.
机译:本发明涉及用于外差干涉测量测量的频率移位器,其包括芯片,输入波导被配置为引导光束,至少四个相位调制器,每个输入波导被布置成从输入波导接收光束并被配置为调制一个相位在光束中,输出组合器被布置为让由每个相位调制器调制的光束干扰,耦合到输出组合器的第一输出波导,并且被配置为在输出组合器,第二输出波导处接收调制的光束,第二输出波导。第二输出波导。耦合到输出组合器并且被配置为接收在输出组合器处破坏性干扰的调制光束,其中输入波导,相位调制器,输出组合器,第一输出波导和第二输出波导被布置在芯片上。

著录项

  • 公开/公告号WO2021116764A1

    专利类型

  • 公开/公告日2021-06-17

    原文格式PDF

  • 申请/专利权人 ROCKLEY PHOTONICS LIMITED;

    申请/专利号WO2020IB01033

  • 发明设计人 GROTE RICHARD;

    申请日2020-12-11

  • 分类号G02F1/025;G02F1/01;G02F1/225;

  • 国家 IB

  • 入库时间 2022-08-24 19:27:15

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