Time-resolved photoemission electron microscope device, hole space distribution detection method, hole lifetime estimation method and hole mobility calculation method

摘要

PROBLEM TO BE SOLVED: To provide a hole space distribution detecting method capable of detecting the behavior of holes. SOLUTION: In the hole space distribution detection method, a sample is irradiated with a pump light having a photon energy larger than the forbidden band width of the sample, and electrons 101 are excited from the valence band of the sample to the conduction band of the sample. The sample is irradiated with probe light having a photon energy larger than the ionization energy of the valence band, the electrons 101 remaining in the valence band are emitted from the sample as photon 103, and the spatial distribution of the photon 103 emitted from the sample. It includes detecting the spatial distribution of holes 102 having a complementary relationship with and outputting hole spatial distribution information indicating the spatial distribution of the detected holes 102. [Selection diagram] Fig. 5