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CONVOLUTIONAL NEURAL NETWORK-BASED LENS-FREE HOLOGRAPHIC MICROSCOPIC PARTICLE CHARACTERIZATION METHOD

机译:基于卷积神经网络的无透镜全息微观微观粒子表征方法

摘要

A convolutional neural network-based lens-free holographic microscopic particle characterization method, comprising the steps of: S1, first acquiring a dark field image, and then acquiring a bright field image uniformly illuminated by a light source (1); S2, placing a sample (2) above a sensor (3), acquiring microscopic images of the sample (2) of different refractive indexes, and marking the refractive index of each image; S3, performing flat-field correction on all the holographic microscopic images; S4, calculating centers of all microscopic particles in the images, and cutting images of the microscopic particles; S5, cleaning all the cut images, randomly classifying the images into a training set, a verification set and a test set, taking the training set as input of a convolutional neural network, training a classification network, verifying an effect training parameter on the verification set, and finally, testing a classification effect on the test set, a classification label corresponding to the microscopic particle being a refractive index characterization result of the microscopic particle. Quick, convenient and accurate characterization for biological samples under a large field of view is implemented.
机译:一种基于卷积神经网络的无透视全息性显微镜颗粒表征方法,包括步骤:S1,首先获取暗场图像,然后获取由光源(1)均匀照射的明场图像; S2,将样品(2)放置在传感器(3)上方,获取不同折射率的样品(2)的微观图像,并标记每个图像的折射率; S3,对所有全息显微镜图像进行平场校正; S4,计算图像中的所有微观粒子的中心,以及微观粒子的切割图像; S5,清洁所有切割图像,将图像随机分类为训练集,验证集和测试集,将培训设置为卷积神经网络的输入,训练分类网络,验证验证的效果培训参数最后,测试对测试组的分类效果,对应于微观粒子的分类标签,是微观粒子的折射率表征结果。实施大型视野下的生物样品快速,方便,准确表征。

著录项

  • 公开/公告号WO2021073335A1

    专利类型

  • 公开/公告日2021-04-22

    原文格式PDF

  • 申请/专利权人 NANJING UNIVERSITY;

    申请/专利号WO2020CN115352

  • 发明设计人 CAO XUN;HUANG YE;HUA XIA;YAN FENG;

    申请日2020-09-15

  • 分类号G01N21/41;G01N15;G06T7/73;G06K9;

  • 国家 CN

  • 入库时间 2022-08-24 18:22:39

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