首页> 外国专利> CHROMATOGRAPHIC SPECTROPHOTOMETER AND REFERENCE POSITION DETECTION METHOD

CHROMATOGRAPHIC SPECTROPHOTOMETER AND REFERENCE POSITION DETECTION METHOD

机译:色谱分光光度计和参考位置检测方法

摘要

A diffraction lattice in this chromatographic spectrophotometer disperses light that has been generated by a light source into light having a plurality of different wavelengths. A sample cell receives light of any one of the wavelengths among the plurality of wavelengths of the light dispersed by the diffraction lattice. A photodetector detects light transmitting through the sample cell. A reference position detection unit: causes a motor to rotate in a first direction by a first angle until the amount of light received by the photodetector reaches or exceeds a predetermined threshold value, and then causes the motor to rotate by a second angle that is smaller than the first angle after the amount of light received by the photodetector has reached or exceeded the threshold value, and thereby detects a rotation angle of the motor at which a peak amount of light received by the photodetector appears; and detects a reference position corresponding to a reference angle of the diffraction lattice on the basis of the detected rotation angle.
机译:该色谱分光光度计中的衍射晶格分散在具有多个不同波长的光中被光源产生的光。样品电池接收由衍射晶格分散的光的多个波长之间的任何一个波长的光。光电探测器检测通过样品电池的光。参考位置检测单元:使电动机通过第一角度在第一方向上旋转,直到光电探测器接收的光量到达或超过预定阈值,然后使电动机通过较小的第二角度旋转第二角度由光电探测器接收的光量达到或超过阈值之后的第一角度,从而检测电动机的旋转角度,在该电动机的旋转角度出现光电探测器接收的峰值量;并在检测到的旋转角度地检测与衍射晶格的参考角度对应的参考位置。

著录项

  • 公开/公告号WO2021044704A1

    专利类型

  • 公开/公告日2021-03-11

    原文格式PDF

  • 申请/专利权人 SHIMADZU CORPORATION;

    申请/专利号WO2020JP23847

  • 发明设计人 JURI YUKO;TSUJI SHINJI;

    申请日2020-06-17

  • 分类号G01J3/06;G01J3/18;G01J3/32;G01N30/74;

  • 国家 JP

  • 入库时间 2022-08-24 17:41:25

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