Method for detecting and isolating faults in digital and analog circuits with multiple infrared scanning under conditions of different stimuli

摘要

A method for detecting faults in digital and analog circuits including the steps of thermally stabilizing the circuit, applying electrical stimulus to the circuit for a predetermined time period, scanning the circuit to determine the infrared response, applying another desired electrical stimulus to the circuit for a predetermined time period, scanning the circuit to determine the infrared response, repeating the applying and scanning sequence as desired, and comparing the resulting infrared responses with normal infrared profiles to detect and isolate faults in the circuit.