Test appts for data processor circuit modules - has test signal and comparison unit controlled by peripherals controller

摘要

The apparatus tests electrical modules grouped in assemblies in a data processor having a central unit and a peripheral unit controller, each circuit assembly having a number of inputs and outputs. The apparatus has means for applying binary test elements at each circuit module of an assembly and for collecting the resultant binary elements at the outputs corresponding to the inputs and comparing them with reference elements. The output is marked each time the comparison reveals a difference between a resultant element and the reference element corresponding to the output. The apparatus parts are controlled by the peripheral unit controller so as to carry out tests on all the circuits belonging to the central unit or the peripheral units.