in this lichtelektrischen inkrementalen positoniereinrichtung, according to figure 2, for the definition of a bezugslage two spatially staggered benchmark figures (r i, r i) at the measuring scales (m), with a abtastplatte (a) with two similarly offset ablesestellen ( i and ii), together with the division (t) to be scanned.with the help of a special day gegentaktspur (g) ensures that only both benchmark figures (r i, r i) at a certain bezugslage can be evaluated.that in the event of illumination (l 1 or l 2) a ablesestelle (i or ii) with the operational ablesestelle (i or ii) (reference (r 1 or r i i) for evaluation can be reached.
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