PROCESS FOR THE STUDY OF THE CRYSTALLINE STRUCTURE OF MONOCRYSTALS AND DEVICE FOR CARRYING OUT SAID METHOD

摘要

The invention relates to a method for the study of the crystalline structure of monocrystals comprising IRRADING a monocrystal by an X-ray beam and a diffractometer for carrying out this process. / P p A METHOD OF INVESTIGATING DIFFICULTIES OF DIFFICULT BEAMS THROUGH SAID MONOCRYSTAL THROUGH A LONGITUDINAL ANALYSIS WINDOW AND SCANNING THE PRESUMPTED SPACE TO CONTAIN THE SAID STAINS THROUGH THE LONGITUDINAL ANALYSIS WINDOW. THE DIFFRACTOMETER FOR CARRYING OUT THIS METHOD IS ESSENTIALLY CHARACTERIZED BY THE FACT THAT IT INCLUDES A BASE 1, A GONIOMETRIC PLATINUM 4 ON THE BASE 1, A SUPPORT 11 OF A CRYSTAL 13 TO BE STUDIED, AN X45 RADIATION SOURCE, A LOCATION DETECTOR 21, AT LEAST ONE AMOUNT 30, 31, FIXED ON THE BASE 1, A ROTATING ARM 36 ROTATING ON THIS AMOUNT, THE RADIATION SOURCE X BEING FIXED ON THE ARM 36, IN A WAY TO PIVOTE AROUND THE CRYSTAL. / P P APPLICATIONS FOR DETERMINING THE CRYSTALLINE STRUCTURE OF A MONOCRYSTAL AS PROTEIN. / P