首页> 外国专利> OBSERVING APPARATUS OF POLE FIGURE OF X-RAY DIFFRACTION OF THIN-FILM SAMPLE

OBSERVING APPARATUS OF POLE FIGURE OF X-RAY DIFFRACTION OF THIN-FILM SAMPLE

机译:薄膜样品的X射线衍射图的观察装置

摘要

PURPOSE:To obtain a complete pole figure by only one setting of a sample and thereby to enable the execution of highly precise observation, by a method wherein slender parallel X-rays are made to fall at a small angle on one point on a thin-film sample and the sample is rotated in a reciprocating manner within a range of 90 degrees around the X-rays as an axis. CONSTITUTION:X-rays emitted from an X-ray source 1 and made parallel through a collimator 2 are made to fall on a sample 3. The sample 3 is attached on a base plate 4 and rotated at an angle of 360 degrees (an arrow beta) by a shaft 5 fitted at a right angle to the base plate. The base plate 4 rotates in a reciprocating manner in the direction of an arrow alpha around the axis (p) of the X-rays within a range of 90 degrees, while it is inclined at an angle of about 0.5-5 degrees gamma to the axis (p). On the lateral side of the axis (p), a stage 9 whereon an X-ray detector 6 and a spectral crystal 7 and a solar slit 8 both disposed in front of the detector are mounted is provided and it is rotated (an arrow delta) at a slow speed around a straight line (q), as an axis, which passes through a point of intersection of the sample 3 and the axis (p) and is perpendicular to the surface of paper. The stage 9 is inclined at an angle of about 2gamma degrees to the fitting plane of the collimator 2 and the plane of rotation. By this apparatus, the relationship between a diffraction angle 2theta determined by the rotations alphaand beta and the rotation of the stage 9, and the intensity of diffracted X-rays, can be observed.
机译:目的:通过一种方法,使细长的平行X射线以细角度入射在薄壁上的一个点上,从而仅通过一次采样即可获得完整的极图,从而能够执行高精度的观测。胶片样品,并且样品以X射线为轴在90度范围内往复旋转。组成:从X射线源1发出并通过准直仪2平行的X射线会落在样品3上。样品3附着在基板4上,并以360度角旋转(箭头β)由与底板成直角安装的轴5构成。基板4在90度的范围内围绕X射线的轴(p)沿箭头α方向往复旋转,同时相对于基板4以约0.5-5度的伽玛角倾斜。轴(p)。在轴(p)的侧面,设置有载物台9,在载物台9上安装有X射线检测器6,光谱晶体7和太阳狭缝8,该载物台9和太阳狭缝8均配置在检测器的前方。 )以缓慢的速度围绕一条直线(q)作为轴,该直线穿过样品3与轴(p)的交点并垂直于纸张表面。载物台9相对于准直仪2的安装平面和旋转平面以大约2gamma度的角度倾斜。通过该设备,可以观察到由旋转α和β以及镜台9的旋转所确定的衍射角2θ与衍射X射线的强度之间的关系。

著录项

  • 公开/公告号JPH01270650A

    专利类型

  • 公开/公告日1989-10-27

    原文格式PDF

  • 申请/专利权人 RIGAKU CORP;

    申请/专利号JP19880098156

  • 发明设计人 KOBAYASHI YUJI;

    申请日1988-04-22

  • 分类号G01N23/207;

  • 国家 JP

  • 入库时间 2022-08-22 06:45:24

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