Phases analysis apparatus by X-ray diffraction on textured or non-textured sample using an electronic photodetecter

摘要

1. Phase analysis apparatus by X-ray diffraction on a textured or non-textured sample comprising a source of X-rays emitting, in the direction of a sample mounted on a support, an incident beam of X-rays, a photodetector receiving the X-ray beam diffracted by the sample, a goniometer of the theta - 2 theta to vary the angle of incidence (theta) of the X-ray beam falling on the sample and for displacing by a corresponding angle (2 theta) the photodetector, at least one electronic counter connected on the one hand to the photodetector and on the other hand to a computer serving for processing digital data, and step-by-step motors for displacing the sample-holder about two additional concurrent axes (beta and phi), namely a second axis (beta) always normal to the plane of the sample and a third axis (phi) perpendicular to the first axis (theta) and to the second axis (beta) and tangential to the focussing circle, characterized in that at least the motor 7 controlling the movement about the second axis (beta) is in direct mesh with the sample-holder 49 and the casing 27 containing the motor 7 for driving the sample-holder 49 is itself mounted to rotate, about the third axis (phi), under the direct or indirect control of the associated step-by-step motor 8, via two coaxial elements (32, 33; 104) disposed on the two sides of the casing and fast therewith, which are mounted to rotate on uprights (23, 24), or on pieces added on these uprights, these uprights or these fixed pieces being slit horizontally, on the front side, i.e. towards the incident and reflected X-ray beams, at the level of these beams, the width of each slit being at least equal to the height of these X-ray beams, each rotary element fast with the casing itself being truncated over its length by a volume having a cross section greater than a quadrant in order to allow the passage, along these rotary elements, of incident and diffracted X-ray beams from a glancing incidence (theta = 0 degree) up to normal incidence (theta . 90 degrees) whatever the angle phi of the casing (27) located in the domain phi (0.90) at least.