首页> 外国专利> Multi-stage binary counter equipped for test runs

Multi-stage binary counter equipped for test runs

机译:配备多级二进制计数器以进行测试运行

摘要

Groups of counter stages (ZG1 to ZG4) are formed which are connected to one another, and from their own group output to their own group input, via logic elements (G6 to G21) in such a manner that, in a test mode, the groups successively run through all possible counting stage states so that, overall, relatively few counter pulses are needed for the complete test. IMAGE
机译:形成一组计数器级(ZG1至ZG4),它们相互连接,并通过逻辑元件(G6至G21)从它们自己的组输出到它们自己的组输入,以这种方式在测试模式下,各组依次运行所有可能的计数阶段状态,因此,总体而言,完成整个测试所需的计数脉冲相对较少。 <图像>

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号