首页> 外国专利> METHOD OF ANALYZING INTRON SEQUENCE FOR DETECTING THE ALLEL ADJACENT TO GENE LOCUS AS HALO TYPE AND DISTANT THEREFROM

METHOD OF ANALYZING INTRON SEQUENCE FOR DETECTING THE ALLEL ADJACENT TO GENE LOCUS AS HALO TYPE AND DISTANT THEREFROM

机译:分析与基因位点相邻的等位基因为晕轮型和远距离的等位基因序列的方法

摘要

The present invention provides a method for detection of at least one allele of a genetic locus and can be used to provide direct determination of the haplotype. The method comprises amplifying genomic DNA with a primer pair that spans an intron sequence and defines a DNA sequence in genetic linkage with an allele to be detected. The primer-defined DNA sequence contains a sufficient number of intron sequence nucleotides to characterize the allele. Genomic DNA is amplified to produce an amplified DNA sequence characteristic of the allele. The amplified DNA sequence is analyzed to detect the presence of a genetic variation in the amplified DNA sequence such as a change in the length of the sequence, gain or loss of a restriction site or substitution of a nucleotide. The variation is characteristic of the allele to be detected and can be used to detect remove alleles. Kits comprising one or more of the reagents used in the method are also described.
机译:本发明提供了一种用于检测遗传基因座的至少一个等位基因的方法,并且可以用于直接确定单倍型。该方法包括用跨越内含子序列的引物对扩增基因组DNA,该引物对定义了与待检测的等位基因遗传连锁的DNA序列。引物定义的DNA序列包含足够数量的内含子序列核苷酸来表征等位基因。基因组DNA被扩增以产生等位基因特征的扩增的DNA序列。分析扩增的DNA序列以检测扩增的DNA序列中遗传变异的存在,例如序列长度的改变,限制性位点的获得或缺失或核苷酸的取代。变异是待检测等位基因的特征,可用于检测去除的等位基因。还描述了包含一种或多种在该方法中使用的试剂的试剂盒。

著录项

  • 公开/公告号JPH03139300A

    专利类型

  • 公开/公告日1991-06-13

    原文格式PDF

  • 申请/专利权人 JIINTAIPU AG;

    申请/专利号JP19900224176

  • 发明设计人 MARUKOMU JIEI SAIMONZU;

    申请日1990-08-24

  • 分类号C12N15/09;A61K48/00;C12Q1/68;

  • 国家 JP

  • 入库时间 2022-08-22 06:06:35

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