MEASURING DEVICE FOR RESPONSE CHARACTERISTIC OF FAR INFRARED DETECTOR

摘要

PURPOSE:To measure response frequency characteristics over a wide frequency range continuously by varying the frequency of infrared laser light continuously by using two infrared laser oscillation devices one of which is variable in frequency. CONSTITUTION:Infrared laser light of constant frequency from a laser oscillation device 31 and infrared laser light from a variable frequency semiconductor laser oscillation device 32 are multiplexed by a beam coupler 33 to illuminate a far infrared detector detector 34 to be measured which is arranged in a cryostate 36 through a lens 35. A beam signal generated by the detector 34 is detected by a spectrum analyzer 37. Then, the oscillation frequency of the device 32 is varied to measure the response characteristics of the detector 34 from the relation between the intensity variation and frequency of the beam signal. Therefore, the response frequency characteristics are measured continuously over a wide frequency range to simplify the constitution of the device and facilitate measuring operation.