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METHOD FOR CARRYING OUT VAPOR PHASE EPITAXY OF GAASP MIXED CRYSTAL
METHOD FOR CARRYING OUT VAPOR PHASE EPITAXY OF GAASP MIXED CRYSTAL
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机译:GAASP混合晶体的气相相差法
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摘要
PURPOSE:To obtain a good mixed crystal reduced in pyramid-like defects and point defects by limiting growth temperature in the vicinity of a substrate in vapor phase epitaxy of GaAsP mixed crystal by a chloride CVD method. CONSTITUTION:When a GaAs single crystal substrate 5 is arranged in a reacting tube 1 and PCl3 gas 3a and AsCl3 gas 3b are fed into the reacting tube 1 and a GaAs1-xPx mixed crystal layer is grown on a substrate 5, growing temperature is controlled so as to satisfy temperature conditions expressed by the equation 500x+585=T=500x+605 when the growing temperature in the vicinity of the substrate 5 is T ( deg.C).
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机译:目的:通过氯化镓CVD法限制GaAsP混合晶体气相外延中衬底附近的生长温度,以获得减少金字塔状缺陷和点缺陷的良好混合晶体。组成:将GaAs单晶衬底5放入反应管1中并将PCl3气体3a和AsCl3气体3b送入反应管1中,并在衬底5上生长GaAs1-xPx混合晶体层,控制生长温度因此,当基板5附近的生长温度为T(℃)时,满足由式500x + 585 <= T <= 500x + 605表示的温度条件。
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