首页> 外国专利> METHOD FOR CARRYING OUT VAPOR PHASE EPITAXY OF GAASP MIXED CRYSTAL

METHOD FOR CARRYING OUT VAPOR PHASE EPITAXY OF GAASP MIXED CRYSTAL

机译:GAASP混合晶体的气相相差法

摘要

PURPOSE:To obtain a good mixed crystal reduced in pyramid-like defects and point defects by limiting growth temperature in the vicinity of a substrate in vapor phase epitaxy of GaAsP mixed crystal by a chloride CVD method. CONSTITUTION:When a GaAs single crystal substrate 5 is arranged in a reacting tube 1 and PCl3 gas 3a and AsCl3 gas 3b are fed into the reacting tube 1 and a GaAs1-xPx mixed crystal layer is grown on a substrate 5, growing temperature is controlled so as to satisfy temperature conditions expressed by the equation 500x+585=T=500x+605 when the growing temperature in the vicinity of the substrate 5 is T ( deg.C).
机译:目的:通过氯化镓CVD法限制GaAsP混合晶体气相外延中衬底附近的生长温度,以获得减少金字塔状缺陷和点缺陷的良好混合晶体。组成:将GaAs单晶衬底5放入反应管1中并将PCl3气体3a和AsCl3气体3b送入反应管1中,并在衬底5上生长GaAs1-xPx混合晶体层,控制生长温度因此,当基板5附近的生长温度为T(℃)时,满足由式500x + 585 <= T <= 500x + 605表示的温度条件。

著录项

  • 公开/公告号JPH0421599A

    专利类型

  • 公开/公告日1992-01-24

    原文格式PDF

  • 申请/专利权人 NIPPON MINING CO LTD;

    申请/专利号JP19900124818

  • 发明设计人 UBUSAWA MASAKATSU;KATAGIRI KEIJI;

    申请日1990-05-15

  • 分类号C30B25/16;C30B29/40;H01L21/205;

  • 国家 JP

  • 入库时间 2022-08-22 05:42:05

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