METHOD AND DEVICE FOR ANALYZING ELECTRON DIFFRACTION PATTERN

摘要

PURPOSE:To precisely and easily identify a material by arithmetically forming the model diffraction pattern by an estimated material, and displaying this model diffraction pattern and the measured pattern of electron diffraction pattern overlapped with one over the other. CONSTITUTION:The coordinate of each dot of an electron diffraction pattern recorded on a photograph or imaging plate is read, for example, by coordinate detection by image processing, or directly by use of a magnifying glass with micrometer or a digitizer 1, and inputted to an arithmetic control means 2. The arithmetic control means 2 reads the data of an estimated material estimated by elemental analysis from a disc memory 3 and conducts forming processing of model diffraction pattern to display the obtained model diffraction pattern and the measured net pattern of electron diffraction pattern overlapped with one over the other on a CRT 4. Thus, precise substance identification can be easily and rapidly performed.