首页> 外国专利> Three=dimensional coordinate measurer for sample - uses projector with grating to project strip pattern for quantitative absolute measuring by means of moire technique

Three=dimensional coordinate measurer for sample - uses projector with grating to project strip pattern for quantitative absolute measuring by means of moire technique

机译:样品的三维坐标测量仪-使用带有光栅的投影仪投影条纹图案,从而通过莫尔条纹技术进行定量绝对测量

摘要

The projector (1) is provided with a projection grating (3) so that a strip pattern can be projected onto the test object (6). A camera registers the latter with the superimposed Moire pattern, a reference grating (4) extending in parallel with the projection grating in the observation path. A sliding arrangement is used to move and measure the shift path of a calibrating device w.r.t. the test object at right angles to the gratings' plane.A control and evaluating computer controls the sliding arrangement as well as registering and evaluating the measurement data. A CCD sensor and optics can be used for equalising the grating constants.
机译:投影仪(1)设置有投影光栅(3),从而可以将条形图案投影到测试对象(6)上。照相机用叠加的莫尔图案将后者对准,参考光栅(4)与观察路径中的投影光栅平行延伸。滑动装置用于移动和测量校准装置的位移路径。测试对象与光栅平面成直角。控制和评估计算机控制滑动装置以及记录和评估测量数据。 CCD传感器和光学器件可用于均衡光栅常数。

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