首页> 外国专利> PLASMA-ANNEALING METHOD FOR IMPROVING BARRIER PROPERTY OF EVAPORATED THIN FILM

PLASMA-ANNEALING METHOD FOR IMPROVING BARRIER PROPERTY OF EVAPORATED THIN FILM

机译:等离子退火方法提高蒸发薄膜的阻隔性能

摘要

PURPOSE: To improve a thin-film property on a substrate by carrying vacuum evaporation of a thin film on a substrate in a vacuum environment, and carrying out plasma annealing or heat annealing of the sputter-evaporated thin film, without taking out the substrate from the vacuum environment. ;CONSTITUTION: At an annealing stage, under a condition such that a substrate 30 in a vacuum environment can be transferred between chambers 40, sputter evaporation is carried out in the same vacuum chamber 40 or in a different vacuum chamber. That is, after a thin film has been evaporated on the wafer 30, plasma-annealing or heat-annealing of the evaporated thin film is used for reinforcing a boundary property of an upper part of the evaporated thin film. In the chamber 40, plasma-annealing or heat-annealing may be carried, and in an isolated chamber plasma-annealing may be carried out.;COPYRIGHT: (C)1994,JPO
机译:目的:通过在真空环境中对基板上的薄膜进行真空蒸发,并在不从基板上取出基板的情况下,对溅射蒸发的薄膜进行等离子退火或热退火,来改善基板上的薄膜性能。真空环境。组成:在退火阶段,在使得真空环境中的基板30可以在腔室40之间转移的条件下,在同一真空腔室40或不同的真空腔室中进行溅射蒸发。即,在晶片30上蒸发了薄膜之后,对蒸发的薄膜进行等离子体退火或热退火以增强蒸发的薄膜的上部的边界特性。在腔室40中,可以进行等离子体退火或热退火,而在隔离腔室中,可以进行等离子体退火。;版权所有:(C)1994,JPO

著录项

  • 公开/公告号JPH0677216A

    专利类型

  • 公开/公告日1994-03-18

    原文格式PDF

  • 申请/专利权人 APPLIED MATERIALS INC;

    申请/专利号JP19910249822

  • 发明设计人 MOSELY RODERICK C;GILBOA HAIM;

    申请日1991-09-27

  • 分类号H01L21/318;H01L21/28;H01L21/3205;

  • 国家 JP

  • 入库时间 2022-08-22 04:50:14

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