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surface treatment of stainless steel stålkomponent to device for semiconductor manufacture

机译:不锈钢表面处理对半导体制造设备的影响

摘要

A process for surface treatment which comprises mechanically polishing the surface of a stainless steel component with abrasive grains having particle diameters of 1-10 mu m to such an extent that the surface has a work-strained layer formed therein which is characterized by that X-ray diffraction by the (111) plane of austenitic iron gives the diffraction beams whose half-value width (2 theta ) is greater than 0.5 degree, and subsequently performing heat treatment in an atmosphere in which the partial pressure of oxygen is low, thereby forming an oxide film composed mainly of chromium oxide which has a thickness greater than 200 ANGSTROM and a surface roughness Rmax smaller than 1 mu m. The surface-treated stainless steel exhibits outstanding corrosion resistance to halogen gases such as Cl2, HCl, and F2. It has such a smooth surface that it hardly adsorbs moisture vapor and gases. Therefore, it is suitable for use as components of semiconductor manufacturing apparatus.
机译:一种表面处理方法,包括用粒径为1-10微米的磨粒对不锈钢部件的表面进行机械抛光,使其达到在表面形成加工应变层的程度,其特征在于,X-通过奥氏体铁的(111)面的射线衍射,得到半值宽度(2θ)大于0.5度的衍射光束,接着在氧分压低的气氛中进行热处理,从而形成氧化膜主要由氧化铬构成,其厚度大于200,表面粗糙度Rmax小于1μm。经表面处理的不锈钢对卤素气体(如Cl2,HCl和F2)具有出色的耐腐蚀性。它具有光滑的表面,几乎不吸收水分和气体。因此,适合用作半导体制造装置的部件。

著录项

  • 公开/公告号SE9401586L

    专利类型

  • 公开/公告日1994-11-08

    原文格式PDF

  • 申请/专利权人 KOBE STEEL LTD;

    申请/专利号SE19940001586

  • 发明设计人 TOMARI HARUO;WADA KOJI;HASHIMOTO IKURO;

    申请日1994-05-06

  • 分类号C23C8/14;C21D8/00;C23C8/02;

  • 国家 SE

  • 入库时间 2022-08-22 04:44:14

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