首页> 外国专利> Apparatus for measuring one or more geometric and kinematic parameters of a rotating device positional apparatus to measure any lateral displacement of a geometric center of a device.Apparatus for measuring rotation substantially instantaneous angular position of a rotating device to a reference point set of the device apparatus for measuring substantially the velOcidade instantaneous angular rotation of a device as a rotating device rotates about an axis of rotation device including a rotation object mounted in the devices.Support to rotate around a rotational axis system of X - ray tomography method for the determination of parameters associated with the movement of a circular disc mounted devices assumeYou for rotation in a plane of rotation around a rotational axis.

Apparatus for measuring one or more geometric and kinematic parameters of a rotating device positional apparatus to measure any lateral displacement of a geometric center of a device.Apparatus for measuring rotation substantially instantaneous angular position of a rotating device to a reference point set of the device apparatus for measuring substantially the velOcidade instantaneous angular rotation of a device as a rotating device rotates about an axis of rotation device including a rotation object mounted in the devices.Support to rotate around a rotational axis system of X - ray tomography method for the determination of parameters associated with the movement of a circular disc mounted devices assumeYou for rotation in a plane of rotation around a rotational axis.

机译:用于测量旋转装置位置装置的一个或多个几何和运动学参数的装置,以测量装置的几何中心的任何横向位移。用于测量旋转装置到装置装置的参考点组的基本瞬时角位置的旋转的装置当旋转装置绕旋转轴旋转时,实质上测量装置的velOcidade瞬时角旋转。旋转轴系支持X射线断层扫描法测定参数。与装有圆盘的设备的移动相关联的设备假定您在围绕旋转轴的旋转平面中旋转。

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