METHOD OF DETERMINATION OF BOUNDARIES OF SLOW-WAVE STRUCTURE BANDWIDTH OF MICROWAVE INSTRUMENT

摘要

FIELD: microwave electronics, in particular, travelling-wave micro-wave instruments. SUBSTANCE: the method of detection of boundaries of slow-wave structure bandwidth is realized as follows. First, one signal at frequency f1 and one signal at frequency f2 are applied to the instrument input and output simultaneously. Detecting the maximum values of signals both from the instrument input and output at variation of the accelerating voltage, the dependence of electronic gain on the frequency for the direct and return harmonics at a constant difference of frequencies is measured simultaneously. An abrupt increase of the value of electronic gain is observed on the bandwidth boundary on the return wave at a simultaneous decrease of the value of electronic gain on the direct wave. EFFECT: enhanced accuracy of measurements and truth of the results in the nonlinear mode. 1 dwg