首页> 外国专利> A method for analyzing process data of an industrial device (PROCESS FOR ANALYSIS PROCESS DATA IN AN INDUSTRIAL PLANT)

A method for analyzing process data of an industrial device (PROCESS FOR ANALYSIS PROCESS DATA IN AN INDUSTRIAL PLANT)

机译:工业设备的过程数据的分析方法(工业工厂中的过程数据的分析过程)

摘要

A method for analyzing process data of an industrial plant, in particular a plant facility, to which an accessory (a i ) is automatically controlled, comprising the steps of: Determine the unique feature (m i ) of the process and prepare the parameters (P i ) appropriate for the device process. The presence of the feature m i for each accessory device a i is then checked using the parameters P i to determine whether the feature m i common to the different accessory devices a i , with reference to the accessory device (a i) are common in the (m i) it detects a correlation between which the stride device (ai) and features (m i) combined. The data elements Ii (ai) , Ii (ai) , and Ii (ai) are then calculated in such a manner that the distance L, W between the two data elements Ii The position of the accessory device (a i ) and / or feature (m i ) as I i ( a i ) is displayed.
机译:一种自动控制附件( i )的工厂,特别是工厂设施的过程数据的分析方法,该方法包括以下步骤:确定唯一特征(m i ),并准备适合设备过程的参数(P i )。然后使用参数P i 检查每个附件设备 i 是否存在特征m i ,以确定特征m i)中不同附件设备( i )通用的> i 它检测跨步设备(ai)和要素(m i)的关联。然后以距离L的方式计算数据元素 Ii(ai) Ii(ai) Ii(ai)两个数据元素 Ii 之间的W,附件设备(a i )和/或特征(m i )的位置为I <显示Sub> i( a i )。

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