Ellipse interpolation control method and the NC apparatus of the NC device

摘要

PURPOSE:To easily and surely improve roundness by using elliptical shape data obtained from the operating locus of a machine tool to which roundness control is applied with NC device and performing correction in which elliptical shape supplied as elliptical shape data to the control locus of the NC device is set as a circle. CONSTITUTION:An elliptical interpolation control means 40 to perform elliptical interpolation when the circle is moved is provided. The elliptical interpolation control means 40 is equipped with a circular test 41 externally connected to the NC device 30 and measures the operating locus Lr of the machine tool 10, an ellipse analysis part 42 which generates the elliptical shape data from the measured result of the circular test 41, and ellipse correction parts 43X and 43Y which perform the correction of moving commands 32X and 32Y based on correction coefficients Cx and Cy supplied from a program analysis part 31 based on the output of the ellipse analysys part 42. And the elliptical shape data obtained from the operating locus of the machine tool 10 to which the roundness control is applied is used, and the correction in which the elliptical shape is set as the circle supplied as the elliptical shape data is performed. In such a way, the improvement of the roundness can be easily and surely performed.