Method for observing dynamic processes in atomic or molecular systems

摘要

An image of charged particles, particularly electrons and ions, which have been released from a target (9), is created on a spatial and temporal resolving detector (30) by controlled acceleration or retardation. The charged particles are subjected to at least one inhomogenous electric field on part of the path between the target and the detector. An Independent claim is also given for a high resolution impulse microscope to observe microscopic processes in atomic or molecular structures.