Calibration method and polarized light analytical method of the Mueller polarimeter and the polarized light analytical device and this polarized light analytical device which have the optical constitution component and this optical constitution component for polarized light irregularity

摘要

(57) Abstract This invention regards the polarimeter and the Mueller polarized light analytical meter which consist of the optical constitution component and this optical constitution component for polarized light irregularity. With the optical constitution component modulating the incident light beam (10) which the polarized light is done in line, it sends back that irregularity beam (11). It continues to this constitution component and two degrees modulates the incident beam, the connected phase modulator (6B) is included, both irregularities during both modulating are connected to the device (61) which corrects degree of polarization of light with identical frequency /2. It is sent back with the sample to the polarized light analytical meter, the measurement beam detection device and the processor which accept the irregularity beam are included. N which displays the polarized light state of the beam it has the polarimeter to which offers measuring fixed quantity in the detection device, with the processor making use of fourier transform, m values simultaneously, it processes the factor 16 of the Mueller matrix of the sample under conditions of profit, nm16 and m4 the above-mentioned measuring fixed quantity vis-a-vis respectively.