首页> 外国专利> PROJECTION ALIGNER, MASK STRUCTURE USED FOR THE SAME, EXPOSURE METHOD, SEMICONDUCTOR DEVICE MANUFACTURED USING THE PROJECTION ALIGNER, AND MANUFACTURE OF THE SEMICONDUCTOR DEVICE

PROJECTION ALIGNER, MASK STRUCTURE USED FOR THE SAME, EXPOSURE METHOD, SEMICONDUCTOR DEVICE MANUFACTURED USING THE PROJECTION ALIGNER, AND MANUFACTURE OF THE SEMICONDUCTOR DEVICE

机译:投影仪,用于其的掩膜结构,曝光方法,使用投影仪制造的半导体器件以及半导体器件的制造

摘要

PROBLEM TO BE SOLVED: To extend service life of a mask and to prevent decrease in exposure accuracy by preventing adhesion and deposition of contamination onto the surface of a mask. ;SOLUTION: A mask structure body E having a light catalyst at least in part is used, and an auxiliary light source K for applying auxiliary light appropriate to the mask structural in a chamber N, that is separate from an exposure chamber O, is provided. Another chamber N may be newly provided or a mask cassette chamber for storing the mask structure, when no exposure is made to a body F to be transferred. The auxiliary light source K can also be provided at the exposure chamber O.;COPYRIGHT: (C)2000,JPO
机译:要解决的问题:延长面罩的使用寿命,并通过防止污染物附着和沉积在面罩表面上来防止曝光精度降低。 ;解决方案:使用至少部分具有光催化剂的掩模结构体E,并提供用于在与曝光室O分开的室N中施加适合于掩模结构的辅助光的辅助光源K。 。当不对要转移的物体F进行曝光时,可以新设置另一个腔室N或用于存储掩模结构的掩模盒室。辅助光源K也可以设置在曝光室O .;版权:(C)2000,JPO

著录项

  • 公开/公告号JP2000286187A

    专利类型

  • 公开/公告日2000-10-13

    原文格式PDF

  • 申请/专利权人 CANON INC;

    申请/专利号JP19990093523

  • 发明设计人 CHIBA KEIKO;

    申请日1999-03-31

  • 分类号H01L21/027;G03F1/16;

  • 国家 JP

  • 入库时间 2022-08-22 02:04:45

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