首页>
外国专利>
Method for specifying accurately the topography of a near planar surface involves scanning a surface with a scanning beam while detecting the angle of a measuring beam reflected off the surface
Method for specifying accurately the topography of a near planar surface involves scanning a surface with a scanning beam while detecting the angle of a measuring beam reflected off the surface
展开▼
机译:精确指定近乎平坦表面的形貌的方法包括在用扫描束扫描表面的同时检测从表面反射的测量束的角度
展开▼
页面导航
摘要
著录项
相似文献
摘要
Scanning occurs at first point and at second point laterally displaced at a preset distance(s) in a scanning direction (x). The course of the angle along with the surface structure is reconstructed from the angle difference in the measurements at the first point and at the second point. This is achieved by displacing measuring beam (4, 4') at a preset distance, to measure the angle at both points.
展开▼