首页> 外国专利> Method for specifying accurately the topography of a near planar surface involves scanning a surface with a scanning beam while detecting the angle of a measuring beam reflected off the surface

Method for specifying accurately the topography of a near planar surface involves scanning a surface with a scanning beam while detecting the angle of a measuring beam reflected off the surface

机译:精确指定近乎平坦表面的形貌的方法包括在用扫描束扫描表面的同时检测从表面反射的测量束的角度

摘要

Scanning occurs at first point and at second point laterally displaced at a preset distance(s) in a scanning direction (x). The course of the angle along with the surface structure is reconstructed from the angle difference in the measurements at the first point and at the second point. This is achieved by displacing measuring beam (4, 4') at a preset distance, to measure the angle at both points.
机译:扫描发生在在扫描方向(x)上以预设距离横向偏移的第一点和第二点。根据在第一点和第二点处的测量中的角度差,可以重新构造角度和表面结构。这是通过以预定距离移动测量光束(4、4')来测量两个点的角度来实现的。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号