Covered electrical connection used for testing semiconductor wafers contains a connecting track electrically joined to one end of a connecting structure made of conducting material on a substrate

摘要

Covered electrical connection contains a connecting track electrically joined to one end of a connecting structure made of conducting material on a substrate, a contact on the outer edge of the track to electrically join with a connecting spot, a connecting wire joining an upper surface of the spot with the contact, and an elastomer element arranged below the substrate. Covered electrical connection contains a holder for holding the connecting structure, and an elastomer element arranged below the substrate and giving the electrical connection its flexibility. Independent claims are also included for similar covered electrical connections.