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Method of calibration of an analog-to-digital converter (-, 1984, and the analog-to-digital converter (-, 1984 1984, with a correction of the linearity

机译:校正线性度的模数转换器(-,1984和模数转换器(-,1984 1984)的校准方法

摘要

The calibration method involves generating a calibration signal having at least one frequency component. The calibration signal is then processed in the A/D converter (201) to provide a digital signal. The digital signal is compensated using at least one coefficient. The compensated digital signal is processed to select a distortion component in the signal. The distortion component is produced from the frequency component by non-linearity. A measure of the selected distortion component is obtained. Then the compensation coefficients are adjusted w.r.t the measured value in order to reduce the distortion. The intermodulation distortion between two signals at different frequency can be used to measure the non-linearity.
机译:校准方法包括产生具有至少一个频率分量的校准信号。然后,在A / D转换器(201)中处理校准信号以提供数字信号。使用至少一个系数来补偿数字信号。处理补偿的数字信号以选择信号中的失真分量。失真分量是由非线性的频率分量产生的。获得所选失真分量的度量。然后将补偿系数相对于测量值进行调整,以减少失真。可以使用两个不同频率信号之间的互调失真来测量非线性。

著录项

  • 公开/公告号FR2725328B1

    专利类型

  • 公开/公告日2000-02-11

    原文格式PDF

  • 申请/专利权人 CRYSTAL SEMICONDUCTOR CORPORATION;

    申请/专利号FR19950010022

  • 发明设计人 HENRION W S;

    申请日1995-08-23

  • 分类号H03M1/10;H03M1/66;H03M3/02;

  • 国家 FR

  • 入库时间 2022-08-22 01:40:00

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