Test system for variable selection of IC devices for testing

摘要

A test system for detecting integrated circuit (IC) devices having a short life time. The test system thermally, electrically and functionally tests the IC devices. The test system includes a selection signal generator with a memory device for writing external data into memory cells indicated by address signals and for reading the written external data as device selection signals. A counter sequentially increases the address signals entering into the memory device. The device selection signal patterns can be adjusted according to standard memory test patterns or user defined test patterns.