首页> 外国专利> Cantilever magnetic force sensor for magnetic force microscopy having a magnetic probe coated with a hard-magnetic material

Cantilever magnetic force sensor for magnetic force microscopy having a magnetic probe coated with a hard-magnetic material

机译:用于磁力显微镜的悬臂式磁力传感器,其磁探头涂有硬磁材料

摘要

A magnetic force sensor for detecting a magnetic force of a magnetic sample having a given magnetization direction comprises a magnetic probe having a tip portion. The tip portion is coated with a film of hard- magnetic material effective to maintain the magnetization direction of the probe constant and parallel to the given magnetization direction of the sample. A biasing member has the magnetic probe attached thereto at a free end thereof and is resiliently deflectable in response to the magnetic force between the magnetic probe and the magnetic sample. When the magnetic probe is scanned across the magnetic sample, the distribution of the magnetic force on the magnetic sample is effectively detected.
机译:用于检测具有给定磁化方向的磁性样品的磁力的磁力传感器包括具有尖端部分的磁探针。尖端部分涂有一层硬磁材料薄膜,可有效保持探针的磁化方向恒定并平行于样品的给定磁化方向。偏压构件在其自由端处附接有磁性探针,并且响应于磁性探针和磁性样品之间的磁力而可弹性偏转。当在整个磁性样品上扫描磁性探针时,可以有效地检测到磁性在磁性样品上的分布。

著录项

  • 公开/公告号US6081113A

    专利类型

  • 公开/公告日2000-06-27

    原文格式PDF

  • 申请/专利权人 SEIKO INSTRUMENTS INC.;

    申请/专利号US19940200820

  • 发明设计人 EISUKE TOMITA;NAOTO MORIYA;

    申请日1994-02-23

  • 分类号G01R33/12;G01R33/02;

  • 国家 US

  • 入库时间 2022-08-22 01:36:48

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