Redundancy fuse boxes and redundancy repair structures for semiconductor devices

摘要

A semiconductor device having a reduced number of column redundancy fuse boxes include a plurality of memory blocks having normal and redundant memory cells, a plurality of normal column selection line drivers, a plurality of redundant column selection line drivers, and a column redundancy fuse box. In particular, the normal and redundant column selection line drivers all include fuses. The column redundancy fuse box is connected in common to the plurality of redundant column selection line drivers. Also, the redundancy fuse box comprises a repair address determining portion for pre-latching a repair address and comparing input addresses with the latched repair address to determine whether the input address is the same as the repair address, and a redundancy enable signal generating portion for generating a redundancy enable signal in response to the output signals of the repair address determining portion.