首页> 外国专利> METHOD FOR MEASURING DOSE OF ELECTRON BEAM AND DEVICE FOR ELECTRON BEAM IRRADIATION TREATMENT

METHOD FOR MEASURING DOSE OF ELECTRON BEAM AND DEVICE FOR ELECTRON BEAM IRRADIATION TREATMENT

机译:电子束剂量的测量方法及电子束辐照处理装置

摘要

PROBLEM TO BE SOLVED: To precisely measure the dose of an electron beam outputted from an electron beam(EB) tube and to adjust the dose of the electron beam radiated onto an object to a constant value under control.;SOLUTION: A device for measuring the dose of an electron beam, that consists of a current detecting component 11a and a current measuring component 11b, is placed near the outside of a window 1b of the EB tube 1. The surface of the current detecting component 11a, which is composed of a conductor or a semiconductor, is coated with an insulant coating of a prescribed thickness. Some electrons in the electron beam emitted from the window 1d of the EB tube 1 are caught by the current detecting component 11a to generate a current in it. The generated current is sent from the current measuring component 11b to a controlling component 12, for example, which adjusts the dose of the electron beam emitted from the EB tube 1 to a constant value under control by controlling a filament power source 3. Since a conductor or a semiconductor coated with an insulating film is used as the current detecting component 11a, the dose of the electron beam outputted from the EB tube 1 can be measured precisely, without being affected by a suspended electric charge near the current detecting component 11a.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:精确地测量从电子束(EB)管输出的电子束的剂量,并将辐射到物体上的电子束的剂量调节到可控的恒定值;解决方案:一种测量装置将由电流检测组件11a和电流测量组件11b组成的电子束剂量放在EB管1的窗口1b的外部附近。电流检测组件11a的表面由导体或半导体用预定厚度的绝缘涂层覆盖。从EB管1的窗口1d发射的电子束中的一些电子被电流检测部件11a捕获以在其中产生电流。产生的电流从电流测量部件11b发送到控制部件12,例如,该控制部件12通过控制灯丝电源3在控制下将从EB管1发射的电子束的剂量调整为恒定值。使用导体或涂覆有绝缘膜的半导体作为电流检测组件11a,可以精确地测量从EB管1输出的电子束的剂量,而不受电流检测组件11a附近的悬浮电荷的影响。 ;版权:(C)2001,日本特许厅

著录项

  • 公开/公告号JP2001221898A

    专利类型

  • 公开/公告日2001-08-17

    原文格式PDF

  • 申请/专利权人 USHIO INC;

    申请/专利号JP20000291545

  • 发明设计人 KOMORI MINORU;YAMAGUCHI MASANORI;

    申请日2000-09-26

  • 分类号G21K5/04;

  • 国家 JP

  • 入库时间 2022-08-22 01:32:07

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