首页> 外国专利> MEASURING DEVICE FOR WARPAGE OF FILM CARRIER TAPE FOR MOUNTING ELECTRONIC COMPONENT, AND MEASURING METHOD OF WARPAGE OF FILM CARRIER TAPE FOR MOUNTING ELECTRONIC COMPONENT

MEASURING DEVICE FOR WARPAGE OF FILM CARRIER TAPE FOR MOUNTING ELECTRONIC COMPONENT, AND MEASURING METHOD OF WARPAGE OF FILM CARRIER TAPE FOR MOUNTING ELECTRONIC COMPONENT

机译:电子元件安装用薄膜载带的翘曲的测定装置以及电子元件安装用薄膜载带的翘曲的测定方法

摘要

PROBLEM TO BE SOLVED: To provide a measuring device for warpage of a sample of a film carrier tape for mounting an electronic component and the measuring method of the warpage. ;SOLUTION: This method includes the step, where a sample S of a film carrier tape for mounting an electronic component is placed on a placement table 16, and while a warpage measuring part 11 is moved in the longitudinal direction to the table 16, a laser beam irradiated in the horizontal direction from a laser beam irradiation part 28 provided on one side of a measuring part support member 26 is shieled by the sample S, the height position of the uppermost part of the sample placed on the table 16 is measured by the height position of the laser beam, which does not reach a laser beam light-receiving part 30 provided on the other side of the member 26, and warpage of the film carrier tape is measured by a difference between this height position and the previously measured height position of the surface of the table 16.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:提供一种用于安装电子部件的薄膜载带的样品的翘曲的测量装置以及该翘曲的测量方法。 ;解决方案:该方法包括以下步骤:将用于安装电子元件的薄膜载带的样品S放置在放置台16上,同时将翘曲测量部分11沿纵向方向移动到放置台16上,从设置在测定部支撑部件26的一侧的激光照射部28沿水平方向照射的激光被样品S遮盖,载置在工作台16上的样品的最上部的高度位置由样品S测定。未到达设置在部件26的另一侧的激光束接收部30的激光束的高度位置,通过该高度位置与预先测量的差来测量膜载带的翘曲。工作台表面16的高度位置;版权:(C)2001,JPO

著录项

  • 公开/公告号JP2001189351A

    专利类型

  • 公开/公告日2001-07-10

    原文格式PDF

  • 申请/专利权人 MITSUI MINING & SMELTING CO LTD;

    申请/专利号JP19990374441

  • 发明设计人 GOMA MUTSUMI;

    申请日1999-12-28

  • 分类号H01L21/60;G01B11/255;H01S3/00;

  • 国家 JP

  • 入库时间 2022-08-22 01:27:16

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