首页> 外国专利> CSM TESTING APPARATUS IN BACKWARD CDMA CHANNEL AND TEST DATA GENERATING METHOD

CSM TESTING APPARATUS IN BACKWARD CDMA CHANNEL AND TEST DATA GENERATING METHOD

机译:后向CDMA信道中的CSM测试装置和测试数据生成方法

摘要

PURPOSE: A CSM(Cell Site Modem) testing apparatus in a backward CDMA channel and a test data generating method are provided to increase a reliability and a stability of a channel card by generating a test data to use it as an input data of a test circuit, constructing a white Gaussian noise generating circuit and obtaining a signal-to-noise ratio with an output signal of the White Gaussian noise generating circuit and the test data. CONSTITUTION: A pattern and a speed of a data to be tested are determined, and in this respect, a data of a speed of 1200bps is preferably selected to reduce a burden to a RAM(S1). A quality indicator is added to the data to be tested having a data speed of 9600bps and a 4800bps(S2). The reason for adding the quality indicator only to the 9600bps and 4800bps data is to slow the speed of substantial information data as the amount of the actual data becomes small. A tale bit of 8 bit of every 0 is added to the data(S3). The data is convolution-coded to correct an error generated due to a noise and an interference in a radio interval of the data(S4). A code symbol repetition is performed with the data, one of which is actually transmitted(S5). The data is read to perform a block interleaving. This is to make random a burst error, and the data is recorded in the block interleaver in a line unit and read in a column unit(S6). One of 64 modulated symbols is corresponded to every 6 code symbol for the data(S7). It is determined each data is to be transmitted by using the data transfer rate of a frame and a part of the code for the data(S8). A long code is generated for the data determined to be transmitted(S9). The long code is orthogonally spread to complete a test data(S10).
机译:目的:提供一种在后向CDMA信道中的CSM(Cell Site Modem)测试设备和测试数据生成方法,以通过生成测试数据以将其用作测试的输入数据来提高信道卡的可靠性和稳定性。电路,构造白高斯噪声产生电路,并利用白高斯噪声产生电路的输出信号和测试数据获得信噪比。构成:确定要测试的数据的模式和速度,在这方面,最好选择速度为1200bps的数据,以减轻对RAM(S1)的负担。将质量指标添加到要测试的数据,其数据速度为9600bps和4800bps(S2)。仅将质量指示符添加到9600bps和4800bps数据的原因是,随着实际数据量变小,会降低大量信息数据的速度。每0个8位的标准位添加到数据(S3)。对数据进行卷积编码以校正由于噪声和数据的无线电间隔中的干扰而产生的错误(S4)。对数据执行代码符号重复,其中之一实际上被发送(S5)。读取数据以执行块交织。这是为了使突发错误随机化,并且将数据以行为单位记录在块交织器中,并以列为单位进行读取(S6)。 64个已调制符号之一对应于数据的每6个代码符号(S7)。通过使用帧的数据传输速率和该数据的一部分代码来确定要发送的每个数据(S8)。为确定要发送的数据生成长码(S9)。长码被正交扩展以完成测试数据(S10)。

著录项

  • 公开/公告号KR20010053725A

    专利类型

  • 公开/公告日2001-07-02

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR19990054202

  • 发明设计人 CHOI SE RIM;KANG YONG O;

    申请日1999-12-01

  • 分类号H04B1/69;

  • 国家 KR

  • 入库时间 2022-08-22 01:13:28

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