Equipment for calibrating timing of integrated circuit testing, comprises reference blocks with signal transmission and reference terminals situated in the same positions as the integrated circuit

摘要

Reference blocks (110) designed to fit into fixing unit linking an integrated circuit to test equipment have transmission terminals (117) and reference terminals (118) with connecting paths (120). Signals sent from transmission terminal to reference terminal and vice versa are timed (122,124), stored and maximum values used for calibration. The number of blocks required is equal to the number of high speed terminals on the integrated circuit being tested