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Device and method in a semiconductor memory for erasing/programming memory cells using erase/program speeds stored for each cell

机译:半导体存储器中用于使用为每个单元存储的擦除/编程速度来擦除/编程存储单元的设备和方法

摘要

In a flash memory, flash cells are paired off so each pair includes a memory cell for storing data and a query cell for storing a characteristic analog value representative of the erase or programming speed of the memory cell. To erase a memory cell, the value stored in the query cell with which it is associated is retrieved, the current state of the memory cell is read, and an erase pulse having a pulse width (or amplitude) that is a function of the value retrieved from the query cell and the current state of the memory cell is then sent to the memory cell to erase it. To program a data bit into a memory cell, the value stored in the query cell with which it is associated is retrieved, and a programming pulse having a pulse width that is a function of the data bit and the value retrieved from the query cell is then to the memory cell to program it. Because the value stored in each query cell is characteristic of the particular memory cell with which the query cell is associated, the erase or programming pulse sent to the memory cell is highly accurate and, hence, is unlikely to over-erase or over-program the memory cell. As a result, the time-consuming verification steps required by most conventional flash memories are eliminated.
机译:在闪存中,闪存单元是成对的,因此每对包括用于存储数据的存储单元和用于存储代表存储单元的擦除或编程速度的特征模拟值的查询单元。为了擦除存储单元,要检索存储在与其相关联的查询单元中的值,读取存储单元的当前状态,并使用脉冲宽度(或幅度)作为该值的函数的擦除脉冲从查询单元中检索到的信息,然后将存储单元的当前状态发送到存储单元以擦除它。为了将数据位编程到存储单元中,检索存储在与其相关联的查询单元中的值,并且编程脉冲的脉冲宽度是数据位和从查询单元中检索到的值的函数。然后到存储单元对其进行编程。因为存储在每个查询单元中的值是与查询单元相关联的特定存储单元的特征,所以发送到该存储单元的擦除或编程脉冲非常准确,因此不太可能过度擦除或过度编程存储单元。结果,消除了大多数常规闪存所需要的耗时的验证步骤。

著录项

  • 公开/公告号US6188613B1

    专利类型

  • 公开/公告日2001-02-13

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号US19980168705

  • 发明设计人 H. MONTGOMERY MANNING;

    申请日1998-10-08

  • 分类号G11C160/40;

  • 国家 US

  • 入库时间 2022-08-22 01:05:10

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