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Method for improving the reliability of underfill process for a chip

机译:一种提高芯片底部填充工艺可靠性的方法

摘要

A hole is generated in a substrate. A chip is connected to the substrate by using the chip receiving area of the substrate by using flip chip assembly. The hole is aligned to the chip receiving area of the substrate. Then, a underfill process is performed such that the space between the chip and the substrate will be encapsulated using liquid capsulated material. The liquid capsulated material is injected into the hole from the back side surface of the substrate to the front side surface of the substrate.
机译:在基板上产生孔。通过使用倒装芯片组件,通过使用基板的芯片接收区域将芯片连接到基板。该孔对准基板的芯片接收区域。然后,执行底部填充工艺,使得将使用液体封装材料来封装芯片与基板之间的空间。从基板的背面侧向基板的正面侧将液体密封材料注入到孔中。

著录项

  • 公开/公告号US6221689B1

    专利类型

  • 公开/公告日2001-04-24

    原文格式PDF

  • 申请/专利权人 APACK TECHNOLOGIES INC.;

    申请/专利号US19970957449

  • 发明设计人 CHONG-REN MAA;ALBERT LIN;JIN-CHYUAN BIAR;

    申请日1997-10-24

  • 分类号H01L214/40;H01L214/80;H01L215/00;

  • 国家 US

  • 入库时间 2022-08-22 01:04:31

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