首页> 外国专利> IMPLEMENT FOR MEASURING THICKNESS OF COATING FILM SUCH AS RESIN WAX, COATING, ETC., APPLIED ONTO GENERAL FLOOR, DEGREE OF STAIN, ETC., AND METHOD FOR MAINTAINING ESTHETIC APPEARANCE OF FLOOR SURFACE BY USING THE SAME

IMPLEMENT FOR MEASURING THICKNESS OF COATING FILM SUCH AS RESIN WAX, COATING, ETC., APPLIED ONTO GENERAL FLOOR, DEGREE OF STAIN, ETC., AND METHOD FOR MAINTAINING ESTHETIC APPEARANCE OF FLOOR SURFACE BY USING THE SAME

机译:测量涂在一般地板上的树脂蜡,涂层等厚度的涂膜的厚度,染色等的程度,以及通过使用相同的方法来保持地板的美学外观的方法

摘要

PROBLEM TO BE SOLVED: To measure and manage the thickness of a coating film (1), measure and manage the degree of stain in the coating film (2), substantially reduce the amount of waste of a strong-alkali waste liquid which inevitably occurs when maintenance and management work is performed on a building floor (3), and establish an evaluating method on the maintenance and management work of the floor on an ordering side (4).;SOLUTION: The purpose (1) is achieved by using metals (aluminum, an aluminum alloy, copper, a copper alloy, etc.), except iron or a stainless marker without magnetism and an eddy-current coating thickness gauge. The purpose (2) is achieved by both a marker of which the surface is coated with white or a light color and reference coated plates for comparing the degree of stain. The purpose (3) is achieved since it is possible to perform preventive management before wax on the floor is decisively stained by continuously executing a means for achieving the purposes (1) and (2). The purpose (4) is achieved since it is possible to easily obtain objective numerical values for determining quality by continuously executing the means for achieving the purposes (1) and (2).;COPYRIGHT: (C)2002,JPO
机译:解决的问题:测量和管理涂膜(1)的厚度,测量和管理涂膜(2)的污渍程度,显着减少不可避免地发生的强碱废液的浪费量在建筑物地板(3)上进行维护和管理工作时,并建立对订购侧地板的维护和管理工作的评估方法(4).;解决方案:目的(1)通过使用金属来实现(铝,铝合金,铜,铜合金等),但铁或不带磁性的不锈钢标记和涡流涂层测厚仪除外。目的(2)通过其表面涂有白色或浅色的标记物和用于比较污渍程度的参考涂层板来实现。之所以达到目的(3),是因为可以通过连续执行实现目的(1)和(2)的手段,在对地板上的蜡进行果断染色之前进行预防性处理。之所以达到目的(4)是因为可以通过连续执行实现目的(1)和(2)的方法来轻松获得用于确定质量的客观数值。;版权所有:(C)2002,JPO

著录项

  • 公开/公告号JP2002277205A

    专利类型

  • 公开/公告日2002-09-25

    原文格式PDF

  • 申请/专利权人 MANRYU:KK;

    申请/专利号JP20000216680

  • 发明设计人 FUJIWARA HIROAKI;

    申请日2000-06-13

  • 分类号G01B7/06;B05D3/00;

  • 国家 JP

  • 入库时间 2022-08-22 00:58:22

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