首页> 外国专利> STANDARD SAMPLE FOR ANALYSIS AND ITS DATA ACQUISITION METHOD AS WELL AS METHOD AND APPARATUS FOR X-RAY ANALYSIS BY USING STANDARD SAMPLE

STANDARD SAMPLE FOR ANALYSIS AND ITS DATA ACQUISITION METHOD AS WELL AS METHOD AND APPARATUS FOR X-RAY ANALYSIS BY USING STANDARD SAMPLE

机译:用于分析的标准样品及其数据获取方法以及使用标准样品进行X射线分析的方法和装置

摘要

PROBLEM TO BE SOLVED: To provide a standard sample, for an analysis, which can have a shape in which a plurality of metal substances are stuck as a single product and to provide its data acquisition method as well as to provide a method and an apparatus for an X-ray analysis by using the standard sample.;SOLUTION: Since the standard sample for the analysis has the shape in which the plurality of metal substances are stuck onto the same substrate, the standard sample, for the analysis, which has the shape in which the plurality of metal substances are stuck can be obtained as the single product. A part which has the shape in which the plurality of metal substances are stuck within the range of an analytical visual field is made to exist, it is moved in such a way that an area occupied by the part is changed, and the shape in which the plurality of metal substances are stuck is measured. Thereby, by the standard sample for the analysis as the single product, not only data on a plurality of stuck shapes but also data on the intermediate stuck shape of a plurality of samples can be acquired easily.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:提供用于分析的标准样品,该样品可以具有将多种金属物质作为单个产品粘在一起的形状,并提供其数据采集方法以及方法和设备解决方案:由于用于分析的标准样品具有将多种金属物质粘附在同一基材上的形状,因此用于分析的标准样品具有作为单一产品,可以得到粘贴有多种金属物质的形状。使具有在分析视野的范围内附着有多种金属物质的形状的部分存在,以使该部分所占的面积变化的方式移动,并形成其中测量粘附的多种金属物质。从而,通过作为单一产品进行分析的标准样品,不仅可以容易地获取多个样品的粘附形状的数据,而且还可以容易地获取多个样品的中间粘附形状的数据。(COPYRIGHT:(C)2002,JPO

著录项

  • 公开/公告号JP2002148226A

    专利类型

  • 公开/公告日2002-05-22

    原文格式PDF

  • 申请/专利权人 RIGAKU INDUSTRIAL CO;

    申请/专利号JP20000346584

  • 发明设计人 YAMAGAMI MOTOYUKI;

    申请日2000-11-14

  • 分类号G01N23/223;G01N1/00;

  • 国家 JP

  • 入库时间 2022-08-22 00:57:08

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