首页> 外国专利> PROJECTION ALIGNER, PROJECTION ALIGNING METHOD, DEVICE- MANUFACTURING METHOD, AND MAINTENANCE METHOD FOR SEMICONDUCTOR MANUFACTURING FACTORY, AND THE PROJECTION ALIGNER

PROJECTION ALIGNER, PROJECTION ALIGNING METHOD, DEVICE- MANUFACTURING METHOD, AND MAINTENANCE METHOD FOR SEMICONDUCTOR MANUFACTURING FACTORY, AND THE PROJECTION ALIGNER

机译:半导体制造厂的投影警报器,投影警报方法,设备制造方法和维护方法以及投影警报器

摘要

PROBLEM TO BE SOLVED: To eliminate downtime of a device, caused by the processes of printing to and developing a pilot wafer by minimizing the number of the processes.;SOLUTION: A device for projecting and aligning a pattern on the first substrate to the second substrate via a projecting optical system is provided with a detecting optical system for detecting the position of the second substrate via the first substrate and the projecting optical system, a detecting optical system for detecting the position in the direction of the optical axis of the projecting optical system of the first substrate, and means for controlling the focusing position, when the pattern on the first substrate is projected to the second substrate, based on the detection result of both the substrates.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:通过最小化工序数来消除因打印和显影试验晶片而造成的设备停机;解决方案:一种用于将第一基板上的图案投影并对准第二基板的装置经由投影光学系统的基板设置有用于经由第一基板检测第二基板的位置的检测光学系统和投影光学系统,用于检测沿投影光学系统的光轴方向的位置的检测光学系统。基于第一基板和第二基板的检测结果,当第一基板上的图案被投影到第二基板时,用于控制聚焦位置的装置; COPYRIGHT:(C)2002,JPO

著录项

  • 公开/公告号JP2002151377A

    专利类型

  • 公开/公告日2002-05-24

    原文格式PDF

  • 申请/专利权人 CANON INC;

    申请/专利号JP20000339880

  • 发明设计人 MITOME NORIYUKI;

    申请日2000-11-08

  • 分类号H01L21/027;G03F9/02;

  • 国家 JP

  • 入库时间 2022-08-22 00:56:27

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