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MODIFYING CIRCUIT DESIGNS RUNNING FROM BOTH EDGES OF CLOCK TO RUN FROM POSITIVE DESIGNS RUNNING FROM BOTH EDGES OF CLOCK TO RUN FROM POSITIVE EDGE
MODIFYING CIRCUIT DESIGNS RUNNING FROM BOTH EDGES OF CLOCK TO RUN FROM POSITIVE DESIGNS RUNNING FROM BOTH EDGES OF CLOCK TO RUN FROM POSITIVE EDGE
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机译:修改从时钟的两个边缘到正向运行的电路设计从时钟的两个边缘到从正边运行的正设计
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摘要
A system and method for increasing test coverage of digital integrated circuits is provided. Clock trees are examined and circuits modified to provide for a greater number of flip-flops operating off of a positive clock edge as viewed from a clock origin.
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