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Thin-film phase plate, phase-contrast electron microscope using same, and method of preventing charging of phase plate

机译:薄膜相板,使用该相板的相衬电子显微镜及其防止相板带电的方法

摘要

An antistatic phase plate for use in a phase-contrast electron microscope. The phase plate is made of a thin film held on the objective aperture of the microscope for shifting the phases of incident and scattered electron waves by a uniform amount. The thin film is a conductive amorphous material typified by amorphous carbon and amorphous gold or a composite of such conductive amorphous materials. A genuinely circular, microscopic electron passage hole is formed in the center of the opening in the objective aperture. Alternatively, a genuinely circular amorphous material is deposited on the center of the opening in the objective aperture to delay the phase of electron waves by &pgr;.
机译:用于相衬电子显微镜的抗静电相板。相板由保持在显微镜物镜孔上的薄膜制成,用于使入射和散射电子波的相位均匀移动。薄膜是以非晶碳和非晶金为代表的导电非晶材料或这种导电非晶材料的复合物。在物镜孔的开口的中心形成真正的圆形的微观电子通过孔。或者,在物镜孔的开口的中心沉积真正圆形的非晶态材料,以使电子波的相位延迟&pgr;。

著录项

  • 公开/公告号US2002011566A1

    专利类型

  • 公开/公告日2002-01-31

    原文格式PDF

  • 申请/专利权人 JEOL LTD.;

    申请/专利号US20010818239

  • 发明设计人 RADOSTIN S. DANEV;KUNIAKI NAGAYAMA;

    申请日2001-03-27

  • 分类号G21K7/00;G01N23/00;

  • 国家 US

  • 入库时间 2022-08-22 00:49:11

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