首页> 外国专利> Evaluation of a technology library for use in an electronic design automation system that converts the technology library into non-linear, gain-based models for estimating circuit delay

Evaluation of a technology library for use in an electronic design automation system that converts the technology library into non-linear, gain-based models for estimating circuit delay

机译:评估在电子设计自动化系统中使用的技术库,该技术将技术库转换为基于增益的非线性模型以估计电路延迟

摘要

An evaluation system for evaluating the suitability of a target technology library for use with an electronic design automation system that converts the target technology library into a scalable library having non-linear, gain-based delay models for estimating circuit delay. After a library analysis process executes, an internal scalable library is generated having a scalable cell model for each functional cell class of the target technology library. Internal characteristics of the scalable library are analyzed to determine whether or not the target technology library is suitable for generating a suitable scalable library. Suitable scalable libraries are used for gain-based structuring and mapping processes. The library evaluation processes uses several metrics to determine the suitability the target technology library. The first metric is the number of sizes metric and the second metric is the size consistency metric. The number of sizes metric is computed with respect to subsets (e.g., basic set and extended set) of the scalable cells identified within the scalable library. The number of sizes metric determines whether or not there are sufficient numbers of discrete cells within the cell clusters of the subsets. The size consistency metric examines the input pin capacitance ratios and the delay error amounts for discrete cells of the scalable library. An evaluation report is then compiled using the above metric information to grade library suitability.
机译:一种评估系统,用于评估与电子设计自动化系统一起使用的目标技术库的适用性,该系统将目标技术库转换为具有非线性,基于增益的延迟模型以估计电路延迟的可扩展库。在执行库分析过程之后,将生成内部可伸缩库,该库具有针对目标技术库的每个功能单元类的可伸缩单元模型。分析可伸缩库的内部特性,以确定目标技术库是否适合于生成合适的可伸缩库。合适的可伸缩库用于基于增益的结构化和映射过程。库评估过程使用多种指标来确定目标技术库的适用性。第一个度量是尺寸数量度量,第二个度量是尺寸一致性度量。相对于在可伸缩库中识别出的可伸缩单元的子集(例如,基本集和扩展集)计算大小数量度量。大小数度量标准确定子集的单元集群中是否有足够数量的离散单元。大小一致性度量标准检查可伸缩库中离散单元的输入引脚电容比和延迟误差量。然后,使用上述指标信息来编译评估报告,以评估库的适用性。

著录项

  • 公开/公告号US6446240B1

    专利类型

  • 公开/公告日2002-09-03

    原文格式PDF

  • 申请/专利权人 SYNOPSYS INC.;

    申请/专利号US19990451467

  • 发明设计人 MAHESH IYER;ASHISH KAPOOR;

    申请日1999-11-30

  • 分类号G06F175/00;

  • 国家 US

  • 入库时间 2022-08-22 00:47:26

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