首页> 外国专利> AUTOMATIC MEASURING APPARATUS AND METHOD FOR THE INVESTIGATION OF THE MASS CURRENT DENSITY OF GRANULAR MATERIALS, BASED ON THE PRINCIPLES OF NONLINEAR PHYSICS

AUTOMATIC MEASURING APPARATUS AND METHOD FOR THE INVESTIGATION OF THE MASS CURRENT DENSITY OF GRANULAR MATERIALS, BASED ON THE PRINCIPLES OF NONLINEAR PHYSICS

机译:基于非线性物理原理的颗粒材料质量电流密度的自动测量装置和方法

摘要

u2122nmu0171ku00f6du0151 measurement system and process for solid granular anyagu0151k, granu0171lu00e1tu0171mtermu00e9kek fu0151lyu00e9ku0151nysu00e1gu00e1t typical of mass flow rate, mass flow rate, density, the principle of nonlinear physics alapu0171lu00f3 meghatu00e1ru0151zu00e1su00e1ra,azzaljellemezve hu0151gy stopcock, a specimen holder (6) of 0.3 1.3 cm u00e1tmu00e9ru0151ju0171au0171tu0151matiku0171san vu00e1ltu0151ztathatu00f3 nyu00edlu00e1su0151ku0151n (13) of 0.1 to 5.0 and idu0151tartu0151mu00e1nyu0151nbelu00fcl according to periods of time during pru0151gram szabu00e1lyu0151zu0151tt kifu0151lyu00f3 anyagnyu0171galmi tu00f6megjeleibu0151l the mass flow rate, mass flow rate, density, or according to adatu0151katlineu00e1ris hatvu00e1nyfu00fcggvu00e9ny appreciatesru00f6vididu0151egysu00e9gekhez or / and tartu0151zu00f3 dinamiku0171s hu00e1nyadu0151su00e1naksu0151ru0151zatu00e1bu00f3l nonlinear physical phenomenon of the units of the standard deviation values cu00e9lju00e1bu00f3lstatisztikai adatu0151kat produces u0151lyan mu00f3du0151n,the driving force of the gravity hu0151gy mintatartu00f3tu00f6lcsu00e9rben u00e1llandu00f3su00edtu00e1su00e1ra the granu0171lu00e1tu0171mu0151szlu0151pmagassu00e1gu00e1t u0171tu00e1ntu00f6ltu0151 tank (1 and 2) fu0151lytu0151nu0151san u00e1llandu00f3u00e9rtu00e9ken holds,while at the same time, the operation of the control ismerteszku00f6zu00f6kbu0151l measurement system is built.the results feldu0151lgu0151zu00f3szu00e1mu00edtu00f3gu00e9p tu0151vu00e1bbu00e1 data acquisition and display units which have held the results biztu0151su00edtju00e1ku00e9s itself is known mu00f3du0151n solid granular termu00e9kekfizikai quality characterization.a manufacturing elju00e1ru00e1su0151k u0151ptimu00e1lu00e1su00e1raalkalmazzu00e1k.
机译:固体颗粒Anyag的测量系统和过程 g2122nm u0171k u00f6d u0151g,gran u0171l u00e1t u0171mterm u00e9kek f u0151ly u00e9k u0151nys u00e1g u00e1t典型的质量流率,非线性物理原理alap u0171l u00f3 meghat u00e1r,azzaljellemezve h u0151gy旋塞,标本支架(6)为0.3 1.3 cm u00e1tm u00e9r u0151j u0171a u0171san v u00e1lt u0151ztathat u00f3 ny u00edl u00e1s u0151k u0151n(13)为0.1到5.0,且id u0151tart u0151m u00e1ny u0151nbel u00fcl根据pr u0151gram中的时间段 u0151tt kif u0151ly u00f3 anyagny u0171galmi t u00f6megjeleib u0151l质量流率,质量流率,密度或根据adat u0151katline u00e1ris hatv u00e1nyf u00fcggv u00e9y u00e9ny / and tart u0151z u00f3 dinamik u0171s h u00e1nyad u0151s u00e1naks u0151r u0151zat u00e1b u00f3l非线性物理现象标准偏差值c u00e9lj u00e1b u00f3lstatisztikai adat u0151kat的单位中的一个enon产生 u0151lyan m u00f3d u0151n,重力的驱动力 u0151gy mintatart u00f3t u00f6lcs u00e1l u00e1s u00e1ra Gran u0171l u00e1t u0171m u0151szl u0151pmagass u00e1g u00e1t u0171t u00e1nt u00f6lt u0151储罐(1和2)f u0151lyt u0151n u001 ,同时建立了控制ismerteszk u00f6z u00f6kb u0151l测量系统的操作。结果feld u0151lg u0151z u00f3sz u00e1m u00edt u00f3g u00e9p t u0151v u00e1bb数据具有结果bizt u0151s u00edtj u00e1k u00e9s本身的显示单元和已知的m u00f3d u0151n固体颗粒项 u00e9kekfizikai质量表征。制造elj u00e1r u00e1s u0151k u0151ptim u00 u00e1k。

著录项

  • 公开/公告号HU9802527A3

    专利类型

  • 公开/公告日2002-05-28

    原文格式PDF

  • 申请/专利权人 MEDITOP GYOGYSZERIPARI KFT. PILISBOROSJENOE;

    申请/专利号HU19980002527

  • 发明设计人

    申请日1998-11-04

  • 分类号G01F1/20;

  • 国家 HU

  • 入库时间 2022-08-22 00:45:06

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