首页> 外国专利> A method for characterizing samples based on intermediate statistical data.

A method for characterizing samples based on intermediate statistical data.

机译:一种基于中间统计数据表征样本的方法。

摘要

The invention relates to a method for characterizing samples which contain units, including the steps of: a) monitoring intensity fluctuations of the emitted, scattered and / or reflected by the unit in at least one measurement volume radiation with at least a detection means that is able to detect emitted, scattered and / or reflected radiation by said unit, b) determining from said fluctuations intermediate intensity statistical data including at least functions dimensional joint statistics, c) determining the information concerning joint distributions of units via said intermediate statistical data.
机译:本发明涉及一种用于表征包含单元的样品的方法,该方法包括以下步骤:a)利用至少一个检测装置,在至少一个测量体积辐射中监测由该单元发射,散射和/或反射的强度波动。能够检测由所述单元发出的,散射的和/或反射的辐射,b)从所述波动确定至少包括函数尺寸联合统计的中间强度统计数据,c)经由所述中间统计数据确定与单元的联合分布有关的信息。

著录项

  • 公开/公告号ES2173600T3

    专利类型

  • 公开/公告日2002-10-16

    原文格式PDF

  • 申请/专利权人 EVOTEC OAI AG;

    申请/专利号ES19980933601T

  • 发明设计人 KASK PEET;

    申请日1998-06-10

  • 分类号G01N21/64;

  • 国家 ES

  • 入库时间 2022-08-22 00:41:26

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号