首页> 外国专利> NONVOLATILE MEMORY HAVING CONTACTLESS ARRAY STRUCTURE WHICH CAN RESERVE SUFFICIENT ON CURRENT WITHOUT INCREASING RESISTANCE EVEN IF WIDTH OF BIT LINE IS REDUCED AND CREATION OF HYPERFINE STRUCTURE IS TRIED AND METHOD OF MANUFACTURING NONVOLATILE MEMORY

NONVOLATILE MEMORY HAVING CONTACTLESS ARRAY STRUCTURE WHICH CAN RESERVE SUFFICIENT ON CURRENT WITHOUT INCREASING RESISTANCE EVEN IF WIDTH OF BIT LINE IS REDUCED AND CREATION OF HYPERFINE STRUCTURE IS TRIED AND METHOD OF MANUFACTURING NONVOLATILE MEMORY

机译:非易失性存储器具有连续的阵列结构,即使减小了位线的宽度并创建了超精细结构,并且仍采用了制造非易失性的方法,它可以在电流上保留足够的电流而不会增加电阻

摘要

Non-volatile memory includes a semiconductor region 1 and the impurity diffusion layer 5 of the second conductivity type of the first conductivity type. Impurity diffusion layer 5 is formed by doping a first impurity of a second conductivity type different from the first conductivity type and a predetermined region of the semiconductor region (1). Impurity diffusion layer 5 is used as a bit line. Impurity diffusion layer (5) is an impurity concentration of substantially has a specific layer or more 1 × 10 18-3, the previously referred to the diffusion length in the widthwise direction A from the predetermined area and to the thickness d of a specific layer in the depth direction B when, B
机译:非易失性存储器包括半导体区域1和第一导电类型的第二导电类型的杂质扩散层5。通过掺杂不同于第一导电类型的第二导电类型的第一杂质和半导体区域(1)的预定区域来形成杂质扩散层5。杂质扩散层5用作位线。杂质扩散层(5)是实质上具有特定层以上的杂质浓度的杂质层1×10 18 -3,当B时,从预定区域A到深度A的特定层的厚度d

著录项

  • 公开/公告号KR100320882B1

    专利类型

  • 公开/公告日2002-02-04

    原文格式PDF

  • 申请/专利权人 NULL NULL;

    申请/专利号KR19990012617

  • 申请日1999-04-09

  • 分类号H01L21/8247;

  • 国家 KR

  • 入库时间 2022-08-22 00:30:03

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