首页> 外国专利> Interferometer for determining test sample dimensions has reference mirror and receiver, which are laterally offset relative to the interferometer's optical axis

Interferometer for determining test sample dimensions has reference mirror and receiver, which are laterally offset relative to the interferometer's optical axis

机译:用于确定测试样品尺寸的干涉仪具有参考镜和接收器,它们相对于干涉仪的光轴横向偏移

摘要

The device (4) is integrated into a tool (1) or mounted in a tool holder and has at least one light source (10) whose light is divided into reference and measurement beams. The measurement beam passes to a measurement point on the test object and the reference beam passes to a reference mirror. The reflected incoherent beams are recombined in the beam divider and passed to a receiver (13). The mirror and receiver are laterally offset from the measurement device's optical axis.
机译:装置(4)被集成到工具(1)中或被安装在工具保持器中,并且具有至少一个光源(10),该光源的光被分为参考光束和测量光束。测量光束通过测试对象上的测量点,参考光束通过参考镜。反射的非相干光束在分束器中重新组合并传递到接收器(13)。反射镜和接收器从测量设备的光轴横向偏移。

著录项

  • 公开/公告号DE10029383A1

    专利类型

  • 公开/公告日2002-01-03

    原文格式PDF

  • 申请/专利权人 JOHANN & ERNST LINK GMBH & CO KG;

    申请/专利号DE2000129383

  • 发明设计人

    申请日2000-06-21

  • 分类号G01B11/24;G01B9/023;B23Q17/24;

  • 国家 DE

  • 入库时间 2022-08-22 00:27:40

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