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Method and device for correcting a resampler subjects a scanned-in input signal to an input scanning rate while using a chip frequency varying from an input frequency and a scan rate of an output signal matching the chip frequency.
Method and device for correcting a resampler subjects a scanned-in input signal to an input scanning rate while using a chip frequency varying from an input frequency and a scan rate of an output signal matching the chip frequency.
A scanned-in input signal (SD) is subject to an input scanning rate and has a chip frequency (fC) that varies from an input frequency (FA). A scan rate of an output signal matches the chip frequency. The scanned-in input signal is changed over by a resampling factor through altering the input frequency. A non-linear operational element (8) subjects the input signal to a non-linear operation so that a spectral line occurs in the chip frequency.
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