Integrated semiconducting component with bridgeable input low pass filter has data bus connection(s), low pass filter connected to connection, circuit for bridging filter for test purposes

摘要

The device has at least one connection (IN) for connecting to a data bus, a low pass filter (TP) connected after the connection and a circuit (DEMUX1, MUX2) for bridging the low pass filter for test purposes. The connection or connections is/are designed for connection to an IC bus. The bridging circuit contains a demultiplexer and a multiplexer.